VIEW

Leading Video Coordinate Measureing Systems

Many measurement techniques offer high accuracy, but few combine precision and high throughput in a production-worthy tool. VIEW’s high-productivity platforms combine high-speed sensors and transport technologies with advanced optics and metrology software for unparalleled process capability. No other metrology company offers the productivity and flexibility that VIEW delivers.

Want more information about this builder?

Machine Inquiry

Technology Highlights from VIEW

Continuous Image Capture (CiC)

CiC™ measurement takes “snapshots” of a part image as the part is continually moved beneath the system optics. VIEW’s exclusive CiC technique can map a large surface area, stitching together individual images so they can be analyzed as a whole. Depending on the part geometry being measured, cycle time is reduced significantly without compromising measurement performance.

3D Surface Measurement

AMF™ is an advanced video analysis technique that uses the data collected from a normal video auto-focus step and turns it into a 3D image of a feature. In addition to 3D information, it provides height or depth measurement of multiple features of a single image. This technique can be used to measure flatness, roughness, height, and volume. It is faster than any scanning method requiring XY stage motion.